Mid Infrared Spectromicroscopy (Mid-IR)

Attenuated Total Reflection

Background

In an Attenuated Total Reflection (ATR) measurement, the internal reflection element (IRE) is pressed in contact with the sample. An evanescent wave penetrates the surface layer of the sample to a depth of between 0.3 and 3 µm as a function of the measured energy. The constant penetration depth limits the effective pathlength through the material and allows measurement of thick samples with

Samples

ATR is great for non-reflective samples and samples that cannot be thinly prepared (for transmission experiments). Direct contact between the germanium crystal and the sample is required and this may not be appropriate or desired in some cases.

Results

ATR spectra are similar to transmission Absorbance spectra and can be qualitatively directly compared. Quantitatively, the absorbance reported varies as a function of energy due to changing penetration depth, which can be corrected with a simple calculation.

In the case of ATR imaging, the field of view is fixed and limited. Unlike other imaging methods, the images cannot be stitched together to create larger effective areas.

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Available Accessories at Mid-IR

Measurements which are possible depend on the ATR accessory used:

Accessory

Endstation

Measurement Type

Source

Internal Reflection Element

Micro-ATR

Bruker

single point spectromicroscopy

Synchrotron globar

Ge

Macro-ATR

Bruker

ATR imaging (200 x 200 µm FOV)

Synchrotron globar

Ge

horizontal ATR microscope

Bruker

custom ATR imaging &
single point spectromicroscopy

Synchrotron globar

User-supplied

ATR Imaging

Agilent

infrared chemical imaging (70 x 70 µm FOV)

globar

Ge

Bulk ATR (PIKE)

Agilent

bulk ATR

globar

Ge

Variable-angle ATR (PIKE)

IRsweep

time-resolved spectroscopy

globar ir laser

User-supplied